STALEFOOTER
© 2009 on all eight public pages.
A 2026 buyer sees a 2009 copyright before they see a technique.
© 2009 Advanced Materials Analysis, Inc.
×
Website proposal
Advanced Materials Analysis, Inc.
Advanced Materials Analysis, Inc.Independent analytical laboratory
Independent analytical laboratory · Mountain View, CA
Precision at
every layer.
SIMS depth profiling, XPS surface chemistry, AFM topography and Hall Effect characterization — the technical depth is already here. This proposal gives it a front door worthy of the data.
- CamecaMagnetic-sector SIMS
- 6 × 6 – 20 × 20 mmPublished Hall sample range
- Room temp & 77 KHall Effect characterization
- Silicon ValleySample pickup
The gap is not the science. It is the path to it.
NEXT · 01 / SITE AUDIT
Prepared for Advanced Materials Analysis, Inc. by Hector Gonzalez · Brandcore
SPECIMEN STAGE · AMA-01
Dimensional artifact
Authentic AMA emblem · illustrative stage
SIMS · O₂⁺ PRIMARY BEAM
Illustrative depth profile · not sample data
Authentic emblem · dimensional specimen concept
The science is 20 years deep.
The website is 2009.
AMA publishes real analytical depth. The public site makes an engineer work to find it — and gives a first-time visitor almost nothing to react to.
amanalysis.com
LIVE CAPTURE
1
2
3
4
INVISIBLEMETA
Empty description and keywords.
The home page publishes an empty string for both. Search results get no authored summary.
<meta name="description" content="">THIN/SERVICES.HTML
Four technique names. No specs.
SIMS, XPS, AFM and Hall Effect are listed without sample size, output or application guidance.
SIMS · XPS · AFM · Hall Effect MeasurementFRICTION/SIMS.HTML
Useful specs. Buried. No intake form.
The technique pages contain usable facts, but the navigation is an eight-link sidebar and the only action is a mailto link.
8 sidebar links · no enquiry formMOBILEHTML SOURCE
No viewport meta. A 2009 table layout.
Built on Plesk Sitebuilder 4.5.0 in HTML 4.01 Transitional — phones get the desktop table.
HTML 4.01 Transitional · no viewport meta
THE COST
An engineer cannot tell, on one screen, whether AMA handles their material, their technique, or their sample size. The site makes them hunt — or leave.
Evidence: eight public HTML pages fetched from amanalysis.com on 30 Oct 2026. Counts and quoted attributes are from the delivered source, not a redesign mockup.
THE PROPOSAL Make the technique, the sample and the next step visible in one screen.
Four techniques.
One chain of evidence.
Lead with what AMA actually measures — technique, sample, output — then let the visitor choose the question they came with.
TECHNIQUE 01 / 04
Dopant & trace-contaminant depth profiles
Cameca double-focusing magnetic sector SIMS. A fine-focused cesium or oxygen primary-ion beam sputters the sample; positive and negative secondary ions are mass analyzed as the profile goes deeper.
- Measures
- Dopant and impurity depth profiles
- Materials
- Si, SiC, III–V, II–VI, CuInGaSe, CdTe, metal films
- Also
- High-precision dose matching for B, P, As
PUBLISHED APPLICATIONS
QuestionTechniqueSampleData
Source: /Sims.html · published by AMA.
PUBLISHED INSTRUMENT SCHEMATICILLUSTRATIVE
Published SIMS schematic · AMA
Illustrative photoelectron spectrum · not sample data
Illustrative topography · not sample data
Illustrative Van der Pauw measurement · not sample data
Published capabilities from AMA's own technique pages. Graphs and diagrams are illustrative explanations — not customer measurements or instrument output.
A front door that
speaks instrument.
Four techniques, real application language and a guided sample enquiry — all in one place. Try the tabs, the technique list and the request flow.
01Service pages02Application matrix03Sample enquiry
amanalysis.com / concept
CONCEPT
Advanced Materials Analysis, Inc.Independent Analytical Laboratory · Mountain View, CA
SIMS · XPS · AFM · HALL EFFECT
See the layer.
See the layer.
Prove the process.
Independent materials characterization for semiconductor, thin-film and advanced-materials teams in Silicon Valley and beyond.
Room temp & 77 K HallSilicon Valley pickupStrict confidentiality
SPECIMEN / DEPTHILLUSTRATIVE
Surface
Oxide
Doped film
Substrate
O₂⁺ beam
depth →
DopantsContaminantsInterfaces
SIMS
Dopant and trace-contaminant depth profiling in Si, SiC, III–V and thin films.
XPS
Chemical bonding, unknown contamination and shallow insulator profiling.
AFM
Quantitative 2D/3D topography, RMS roughness and grain distribution.
Hall Effect
Resistivity, carrier concentration and mobility at room temp and 77 K.
740 Sierra Vista Ave, Suite D · Mountain View(650) 391-4190Sample pickup across Greater Silicon Valley
MATERIALS IN THE PUBLISHED WORK
SiSiCIII–VII–VICuInGaSeCdTeMetal filmsGaN / InP
SAMPLE PATH
- QuestionWhat must the data prove?
- TechniqueRoute to SIMS, XPS, AFM or Hall.
- LogisticsPickup or ship to Suite D.
READY TO TALK SPECIFICS?Tell us what your sample needs to prove.
TECHNIQUES / 04
Start with the question.
Each technique page states what it measures, which materials fit, and what to send.
SIMS / DEPTH PROFILING
Dopants and trace contaminants, layer by layer.
Cameca magnetic-sector SIMS with Cs or O₂⁺ primary ions. Depth profiles for dopants and trace contaminants in Si, SiC, III–V, II–VI, CuInGaSe, CdTe and metal films.
- Typical question
- Where is the dopant, and at what dose?
- Output
- Depth profile / dose matching
- Source
- AMA /Sims.html
APPLICATIONS / FILTER
What are you trying to prove?
Filter the application library by technique. Each card names the analytical question and the route.
Dopant depth profile
B, P or As concentration versus depth after implant or anneal.
Implant dose matching
High-precision dose comparison for implanted and annealed wafers.
Contamination in metal films
Impurity and contamination measurement in Cu, Mo and other interconnect films.
Unknown surface contamination
Chemical bonding and identification of unknown particles or residues.
Insulator depth profiling
Shallow Ar-ion profiling for thin films and insulating surfaces.
Roughness & grain structure
RMS roughness, 2D/3D surface images and grain-size distribution.
Carrier concentration
Resistivity, carrier density and mobility at room temperature or 77 K.
Material type & mobility
Separate determination of carrier type, concentration and mobility.
Illustrative application library built from AMA's published technique pages.
SAMPLE ENQUIRY / CONCEPT
Tell us what the sample needs to prove.
A guided request: material, technique, question, sample size and pickup or shipping. Nothing is submitted in this concept.
Illustrative HTML concept · content structure based on AMA's published capabilities · not a live client site.
We have rebuilt a technical
front door before. Here is the before and after.
United Facilities Group came to Brandcore with a dated site. The rebuild put services, proof and contact actions in the first screen. The same discipline applies to AMA.
Hierarchy
Service categories become the first read, not a paragraph.
Action
Quote and call controls are visible in the first screen.
Credibility
Real project imagery and proof do the selling.
Case study: ufgworks.com. Images are the actual before/after screens used by Brandcore; no performance metric is claimed.
The data deserves
a front door this precise.
I would welcome a 15-minute walkthrough of this concept. We can compare it with your current site and decide what is worth building first.
Your Brandcore contact
Hector Gonzalez
Technical Sales & Automation · Brandcore
“Your published SIMS, XPS, AFM and Hall Effect capabilities deserve a clear, accessible presentation. I would welcome a 15-minute walkthrough of this concept.”
San Francisco Bay Area Sales SolutionsA precise front door is not a design luxury. It is how the next sample finds you.
01Walkthrough
15 minutes; compare this concept with the current site.
02Scope
Agree the pages, content and intake fields worth building first.
03Build
Brandcore coordinates design, build and launch checks.
Prepared for Advanced Materials Analysis, Inc. · Mountain View, CAIndependent proposal · no client-site changes were madeFacts sourced from amanalysis.com · 30 Oct 2026